this technology and this new technique will enable more rapid reliability testing of vertical GaN … semiconductor, GaN devices can operate at higher voltages, reducing the need for lossy step … [27] M. Asif Khan, Q. Chen, C. J. Sun, J. W. Yang, M. Blasingame, M. S. Shur, and H. Park. … [198] A. B. Fowler and A. Hartstein.
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